Gautam, P., Khanal, R., Saw, S. H., & Lee, S. (2015). Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code. Springer US.
Chicago Style CitationGautam, P., R. Khanal, S. H. Saw, and S. Lee. Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code. Springer US, 2015.
MLA CitationGautam, P., R. Khanal, S. H. Saw, and S. Lee. Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code. Springer US, 2015.
Warning: These citations may not always be 100% accurate.