APA Citation

Abdullah, F., Nayan, N., Abdul Jamil , M. M., & Kamsin, N. IDD scan test method for fault localization technique on CMOS VLSI failure analysis.

Chicago Style Citation

Abdullah, Farisal, Nafarizal Nayan, Muhammad Mahadi Abdul Jamil , and Norfauzi Kamsin. IDD Scan Test Method for Fault Localization Technique On CMOS VLSI Failure Analysis.

MLA Citation

Abdullah, Farisal, Nafarizal Nayan, Muhammad Mahadi Abdul Jamil , and Norfauzi Kamsin. IDD Scan Test Method for Fault Localization Technique On CMOS VLSI Failure Analysis.

Warning: These citations may not always be 100% accurate.