Tuan Ahmad, T. M. M. (2015). The development of new backside decapsualtion technique to investigate integrated circuit failure in the automotive application environment.
Chicago Style CitationTuan Ahmad, Tuan Mohd Mustaqim. The Development of New Backside Decapsualtion Technique to Investigate Integrated Circuit Failure in the Automotive Application Environment. 2015.
MLA CitationTuan Ahmad, Tuan Mohd Mustaqim. The Development of New Backside Decapsualtion Technique to Investigate Integrated Circuit Failure in the Automotive Application Environment. 2015.
Warning: These citations may not always be 100% accurate.