APA Citation

Muhamad Amin, M. R. R. (2011). Modified pattern generator of built-in self test for sequential circuits with reduced test time.

Chicago Style Citation

Muhamad Amin, Muhamad Ridzuan Radin. Modified Pattern Generator of Built-in Self Test for Sequential Circuits With Reduced Test Time. 2011.

MLA Citation

Muhamad Amin, Muhamad Ridzuan Radin. Modified Pattern Generator of Built-in Self Test for Sequential Circuits With Reduced Test Time. 2011.

Warning: These citations may not always be 100% accurate.