Abdul Halim, Z. A. (2014). Nanoscale microstructural characterization of aluminum and copper bilayer thin films deposited on silicon substrate using magnetron sputtering technique.
Chicago Style CitationAbdul Halim, Zulhelmi Alif. Nanoscale Microstructural Characterization of Aluminum and Copper Bilayer Thin Films Deposited On Silicon Substrate Using Magnetron Sputtering Technique. 2014.
MLA CitationAbdul Halim, Zulhelmi Alif. Nanoscale Microstructural Characterization of Aluminum and Copper Bilayer Thin Films Deposited On Silicon Substrate Using Magnetron Sputtering Technique. 2014.
Warning: These citations may not always be 100% accurate.