The structural and surface morphology of annealed ZnO films
ZnO thin films were deposited on the glass substrates via the sol-gel dip coating method. The films were annealed at various temperatures ranging from 350 °C to 550 °C. X-ray diffraction (XRD), and atomic force microscopy (AFM) were used to investigate the effect of annealing temperature on the stru...
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Trans Tech Publications
2014
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| நிகழà¯à®¨à®¿à®²à¯ˆ அணà¯à®•à®²à¯: | http://eprints.utm.my/63025/ http://eprints.utm.my/63025/ http://eprints.utm.my/63025/ |
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http://eprints.utm.my/63025/http://eprints.utm.my/63025/
http://eprints.utm.my/63025/