Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A. /

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企业作者: Materials Research Society.
其他作者: Huang, Ting C., Cohen, Philip I., Eaglesham, David J.
格式: 图书
语言:English
出版: Pittsburgh, Pa. : Materials Research Society, 1991.
丛编:Materials Research Society symposia proceedings ; v. 208.
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索引号: A1234.567
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