Image processing and pattern recognition in remote sensing II : 8-9 November, 2004, Honolulu, Hawaii, USA /
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| Corporate Authors: | , |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE,
c2005.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 5657. |
| Subjects: | |
| Tags: |
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| Physical Description: | viii, 128 p. : ill., maps ; 28 cm. |
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| Bibliography: | Includes bibliographical references and author index. |
| ISBN: | 0819456187 |
| ISSN: | 0277-786X ; |