Development of low normal force contact using electro fine forming and lithography technology

This new technology is realized by Photo Resist Lithography and NiCo Electro Fine Forming Process, and enables the design of a small contact spring for applications requiring high density, high speed and high durability. The evaluation result proved the capability of Low Normal Force (0.10N-0.15N at...

Penerangan Penuh

Disimpan dalam:
Butiran Bibliografi
Pengarang-pengarang Utama: Bhuiyan, Moinul, Yamada, Shinji, Kurokawa, Noriharu, Sakamoto, Katsuhiko, Takemasa, Eiichiro
Format: Conference or Workshop Item
Bahasa:English
English
Diterbitkan: 2008
Subjek-subjek:
Capaian Atas Talian:http://irep.iium.edu.my/33190/
http://irep.iium.edu.my/33190/
http://irep.iium.edu.my/33190/1/Development_of_Low_Normal_Force_Contact_Using_Electro_Fine_Forming_and_Lithography_Technology.pdf
http://irep.iium.edu.my/33190/4/TE_Technical_Conference_2008.jpg
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