Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code

The soft X-ray yield versus pressure curves of NX1 and NX2 plasma focus machines have been measured and published for different pressures and electrode configurations. In this work, the numerical experiments are carried out, using Lee model code. The Lee model code is configured for each of these de...

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Butiran Bibliografi
Pengarang-pengarang Utama: Gautam, P., Khanal, R., Saw, S. H., Lee, S.
Format: Artikel
Diterbitkan: Springer US 2015
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Capaian Atas Talian:http://eprints.intimal.edu.my/14/
http://eprints.intimal.edu.my/14/
http://eprints.intimal.edu.my/14/
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