Characterization of semiconductor nanowires using optical tweezers
We report on the optical trapping characteristics of InP nanowires with dimensions of 30 (±6) nm in diameter and 2 - 15 μm in length. We describe a method for calibrating the absolute position of individual nanowires relative to the trapping center using synchronous high-speed position sensing and a...
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| தலைமை எழà¯à®¤à¯à®¤à®¾à®³à®°à¯à®•à®³à¯: | , , , , , , |
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| வடிவமà¯: | கடà¯à®Ÿà¯à®°à¯ˆ |
| மொழி: | English |
| வெளியீடபà¯à®ªà®Ÿà¯à®Ÿà®¤à¯: |
American Chemical Society
2011
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| நிகழà¯à®¨à®¿à®²à¯ˆ அணà¯à®•à®²à¯: | http://psasir.upm.edu.my/24834/ http://psasir.upm.edu.my/24834/ http://psasir.upm.edu.my/24834/ http://psasir.upm.edu.my/24834/1/Characterization%20of%20semiconductor%20nanowires%20using%20optical%20tweezers.pdf |
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