NANOSTRUCTURAL STUDIES OF SPUTTER-DEPOSITED NixAl1-x (0.5 ≤ x ≤ 1.0) ALLOY THIN FILMS

The nanostructural characteristics of direct-current magnetron sputter-deposited NixAl1-x (0.5 ≤ x ≤ 1.0) alloy films were studied during in situ isothermal annealing in a transmission electron microscope. An expansion of the lattice by nearly 5% was observed for the Ni0.5Al0.5 and the Ni0.8Al0.2 fi...

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Pengarang-pengarang Utama: T. Joseph, Sahaya Anand, A.H.W., Ngan
Format: Artikel
Diterbitkan: Universiti Putra Malaysia 2011
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Capaian Atas Talian:http://www.myjurnal.my/public/browse-journal-view.php?id=103
http://www.myjurnal.my/public/browse-journal-view.php?id=103
http://eprints.utem.edu.my/4335/1/MJM_7.pdf
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