AFM, HR-XRD and PL characterization of stacked structures In 0.5Ga0.5As/GaAs quantum dots
In0.5Ga0.5As quantum dots (QDs) stacked structure were studied using atomic force microscopy (AFM), high-resolution X-ray diffraction (HR-XRD) and photoluminescence (PL) characterization. Evolution in the dots size and dots density in the stacked structures is strongly influenced by the dot formatio...
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| Main Authors: | , , , |
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| Format: | Article |
| Published: |
2010
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| Subjects: | |
| Online Access: | http://eprints.utm.my/22812/ http://eprints.utm.my/22812/ http://eprints.utm.my/22812/ |
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