Device and circuit modeling of nano-cmos
The demand for more and ever smaller portable electronic devices has driven metal oxide semiconductor-based (CMOS) technology to its physical limit with the smallest possible feature sizes. This presents various size-related problems such as high power leakage, low-reliability, and thermal effects,...
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| Main Authors: | , , |
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| Format: | Book Section |
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Penerbit UTM
2012
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| Subjects: | |
| Online Access: | http://eprints.utm.my/47760/ |
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