Improvement inaccuracy correlation IC radiated electric fields measurement in GTEM cell to SAC using a correction factor
GTEM cell appears to be a popular test facility for integrated circuits (ICs) radiated emission evaluations in the past. Since the GTEM cell is a single port test device, the GTEM measurement cannot specifically differentiate components between electric and magnetic fields. Both fields are captured...
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| Main Authors: | , , , |
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| Format: | Conference or Workshop Item |
| Published: |
2014
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| Subjects: | |
| Online Access: | http://eprints.uthm.edu.my/6532/ http://eprints.uthm.edu.my/6532/1/198.pdf |
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| Summary: | GTEM cell appears to be a popular test facility for integrated circuits (ICs) radiated
emission evaluations in the past. Since the GTEM cell is a single port test device, the GTEM
measurement cannot specifically differentiate components between electric and magnetic fields.
Both fields are captured as a global quantity in GTEM measurement. It therefore is a suspicion that
the radiated emission measurements using GTEM cell is less precise in contrast to scanning
technique i.e. near field probe scan. However, GTEM cell is a cost effective test device that
provides good ambient shielding to conduct field measurement in broad frequency. The GTEM
measurement usually is associated to semi-anechoic chamber (SAC) measurement. Thus, this study
attempts to improve the correlation of the GTEM to SAC using a correction factor. In particular, a
specific pattern was developed to replicate wide-ranging IC interconnections for the evaluations in
GTEM cell and SAC. The horizontal and vertical electric fields based on the GTEM measurements
were preprocessed using Matlab code before it is ready to attain the correction factor. Finally, the
correction factor is employed to adjust the deviation while correlating the IC radiated electric fields
of GTEM cell to semi-anechoic chamber. The results indicate a great improvement after regulating
the GTEM fields with the correction factor. This implies the GTEM cell measurement is possible to
achieve a good accuracy using a correction factor |
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