Improvement inaccuracy correlation IC radiated electric fields measurement in GTEM cell to SAC using a correction factor
GTEM cell appears to be a popular test facility for integrated circuits (ICs) radiated emission evaluations in the past. Since the GTEM cell is a single port test device, the GTEM measurement cannot specifically differentiate components between electric and magnetic fields. Both fields are captured...
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| Main Authors: | , , , |
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| Format: | Conference or Workshop Item |
| Published: |
2014
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| Subjects: | |
| Online Access: | http://eprints.uthm.edu.my/6532/ http://eprints.uthm.edu.my/6532/1/198.pdf |
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