Simple calibration and dielectric measurement technique for thin material using coaxial probe
This paper focuses on the nondestructive dielectric measurement for thin dielectric material using open-ended coaxial probe. The probe calibration procedure requires only a measurement of a half-space air and three open standard kits. The measured reflection coefficient for thin sample, which is bac...
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Institute of Electrical and Electronics Engineers Inc.
2015
|
| Subjects: | |
| Online Access: | http://eprints.utm.my/55980/ http://eprints.utm.my/55980/ http://eprints.utm.my/55980/ http://eprints.utm.my/55980/1/KokYeowYou2015_SimpleCalibrationandDielectricMeasurementTechnique.pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|