Investigation of threshold voltage and transconductance variations in PMOS
Scaling process of MOSFET has yielded great benefit in term of processor technology evolution. However, it is worth to note that the scaling process also affects the electrical parameters as well. It is expected that as MOSFET gradually scaled into the submicron regime, the variation of electrical p...
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| Main Authors: | , |
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| Format: | Conference or Workshop Item |
| Published: |
2015
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| Subjects: | |
| Online Access: | http://eprints.uthm.edu.my/7185/ http://eprints.uthm.edu.my/7185/1/IC3E_2015_submission_107.pdf |
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