The development of new backside decapsualtion technique to investigate integrated circuit failure in the automotive application environment

The semiconductor industry is the aggregate collection of companies engaged in the design and fabrication of semiconductor devices. To establish the good company of semiconductor, the development of failure analysis organization must be made. Failure analysis is the process of collecting and analyzi...

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Bibliographic Details
Main Author: Tuan Ahmad, Tuan Mohd Mustaqim
Format: Thesis
Published: 2015
Subjects:
Online Access:http://eprints.uthm.edu.my/7577/
http://eprints.uthm.edu.my/7577/1/TUAN_MOHD_MUSTAQIM_BIN_TUAN_AHMAD.pdf
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